標題: CLUSTERING PATENTS USING NON-EXHAUSTIVE OVERLAPS
作者: Trappey, Charles V.
Trappey, Amy J. C.
Wu, Chun-Yi
管理科學系
Department of Management Science
關鍵字: Data mining;patent analysis;patent infringement;non-exhaustive overlap clustering;ontology schema
公開日期: 1-六月-2010
摘要: Patent documents are unique external sources of information that reveal the core technology underlying new inventions. Patents also serve as a strategic data source that can be mined to discover state-of-the-art technical development and subsequently help guide R&D investments. This research incorporates an ontology schema to extract and represent patent concepts. A clustering algorithm with non-exhaustive overlaps is proposed to overcome deficiencies with exhaustive clustering methods used in patent mining and technology discovery. The non-exhaustive clustering approach allows for the clustering of patent documents with overlapping technical findings and claims, a feature that enables the grouping of patents that define related key innovations. Legal advisors can use this approach to study potential cases of patent infringement or devise strategies to avoid litigation. The case study demonstrates the use of non-exhaustive overlaps algorithm by clustering US and Japan radio frequency identification (RFID) patents and by analyzing the legal implications of automated discovery of patent infringement.
URI: http://dx.doi.org/10.1007/s11518-010-5134-x
http://hdl.handle.net/11536/9678
ISSN: 1004-3756
DOI: 10.1007/s11518-010-5134-x
期刊: JOURNAL OF SYSTEMS SCIENCE AND SYSTEMS ENGINEERING
Volume: 19
Issue: 2
起始頁: 162
結束頁: 181
顯示於類別:會議論文


文件中的檔案:

  1. 000279005100004.pdf