Title: Characterization of write-once blu-ray disk containing Cu-Al/Si recording layer using transmission electron microscopy
Authors: Mai, Hung-Chuan
Hsieh, Tsung-Eong
Jeng, Shiang-Yao
材料科學與工程學系
Department of Materials Science and Engineering
Issue Date: 28-Feb-2011
Abstract: Microstructure change in write-once blu-ray disk containing Cu-Al/Si recording layer was investigated by transmission electron microscopy. Nanoscale crystallites were found to comprise of the Cu-Al/Si recording layer before and after signal writing and the energy dispersive spectroscopy revealed insignificant composition fluctuation in disk sample. Analytical results indicated the signal properties of disk samples are correlated with a moderate improvement of crystallinity and the formation of Cu and Si solid-solution phases due to element mixing in mark area, rather than the formation of Cu(3)Si silicide and recrystallization of recording layer as reported by previous studies. (C) 2011 American Institute of Physics. [doi:10.1063/1.3560053]
URI: http://dx.doi.org/10.1063/1.3560053
http://hdl.handle.net/11536/9283
ISSN: 0003-6951
DOI: 10.1063/1.3560053
Journal: APPLIED PHYSICS LETTERS
Volume: 98
Issue: 9
End Page: 
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