Title: Marked enhancement of Neel temperature in strained YMnO(3) thin films probed by femtosecond spectroscopy
Authors: Wu, K. H.
Chen, H-J
Chen, Y. T.
Hsieh, C. C.
Luo, C. W.
Uen, T. M.
Juang, J. Y.
Lin, J-Y
Kobayashi, T.
Gospodinov, M.
Department of Electrophysics
Institute of Physics
Issue Date: 1-Apr-2011
Abstract: In this paper, the (001)-oriented hexagonal YMnO(3) (h-YMO) thin films with various nominal strain states were deposited on MgO(100), MgO(111) and YSZ(111) substrates by pulsed laser deposition. The ultrafast dynamics probed by wavelength-tunable femtosecond pump-probe spectroscopy was performed to disclose the effects of the epitaxial strain on the electronic structure and associated magnetism. Analyses based on the measured transient-reflectivity-change (Delta R/R) curves revealed that while the magnitude of the on-site Mn d-d transition energy E(dd)(T) changes only slightly with the variation of the lattice constant ratio c/a, a marked shift in the antiferromagnetic (AFM) Neel temperature T(N) was observed and the direction of shift was dependent on the type of strain. The possible mechanism for the observed strain effect on the AFM ordering is discussed. Copyright (C) EPLA, 2011
URI: http://dx.doi.org/10.1209/0295-5075/94/27006
ISSN: 0295-5075
DOI: 10.1209/0295-5075/94/27006
Journal: EPL
Volume: 94
Issue: 2
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