Title: Applying Expert Diagnosis Model to Collaborative Design Systems
Authors: Wu, Cheng-Ru
Chang, Che-Wei
Chen, Chiu-Chin
資訊管理與財務金融系 註:原資管所+財金所
Department of Information Management and Finance
Keywords: TFT-LCD Industry;AMS;GRA;Collaborative Design System
Issue Date: 1-Apr-2011
Abstract: Thin film transistor liquid crystal display (TFT-LCD) industry need to control the development budget. The alarm management system (AMS) can test machine alarm. This study uses the grey relational analysis (GRA) the expert evaluation model to measure software quality management system of alarm in order to reduce system failures.
URI: http://dx.doi.org/10.1166/asl.2011.1485
ISSN: 1936-6612
DOI: 10.1166/asl.2011.1485
Volume: 4
Issue: 4-5
Begin Page: 1860
End Page: 1861
Appears in Collections:Articles