標題: Broadband and omnidirectional antireflection employing disordered GaN nanopillars
作者: Chiu, C. H.
Yu, Peichen
Kuo, H. C.
Chen, C. C.
Lu, T. C.
Wang, S. C.
Hsu, S. H.
Cheng, Y. J.
Chang, Y. C.
光電工程學系
Department of Photonics
公開日期: 9-Jun-2008
摘要: Disordered GaN nanopillars of three different heights: 300, 550, and 720 nm are fabricated, and demonstrate broad angular and spectral anti-reflective characteristics, up to an incident angle of 60 degrees and for the wavelength range lambda=300-1800nm. An algorithm based on a rigorous coupled-wave analysis (RCWA) method is developed to investigate the correlations between the reflective characteristics and the structural properties of the nanopillars. The broadband and omnidirectional antireflection arises mainly from the refractive-index gradient provided by nanopillars. Calculations show excellent agreement with the measured reflectivities for both s- and p-polarizations. (c) 2008 Optical Society of America.
URI: http://dx.doi.org/10.1364/OE.16.008748
http://hdl.handle.net/11536/8726
ISSN: 1094-4087
DOI: 10.1364/OE.16.008748
期刊: OPTICS EXPRESS
Volume: 16
Issue: 12
起始頁: 8748
結束頁: 8754
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