Title: Critical thickness and orbital ordering in ultrathin La(0.7)Sr(0.3)MnO(3) films
Authors: Huijben, M.
Martin, L. W.
Chu, Y. -H.
Holcomb, M. B.
Yu, P.
Rijnders, G.
Blank, D. H. A.
Ramesh, R.
Department of Materials Science and Engineering
Issue Date: 1-Sep-2008
Abstract: Detailed analysis of transport, magnetism, and x-ray absorption spectroscopy measurements on ultrathin La(0.7)Sr(0.3)MnO(3) films with thicknesses from 3 to 70 unit cells resulted in the identification of a lower critical thickness for a nonmetallic nonferromagnetic layer at the interface with the SrTiO(3) (001) substrate of only three unit cells (similar to 12 angstrom). Furthermore, linear-dichroism measurements demonstrate the presence of a preferred (x(2)-y(2)) in-plane orbital ordering for all layer thicknesses without any orbital reconstruction at the interface. A crucial requirement for the accurate study of these ultrathin films is a controlled growth process, offering the coexistence of layer-by-layer growth and bulklike magnetic/transport properties.
URI: http://dx.doi.org/10.1103/PhysRevB.78.094413
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.78.094413
Volume: 78
Issue: 9
Begin Page: 
End Page: 
Appears in Collections:Articles