標題: A multiple criteria decision for trading capacity between two semiconductor fabs
作者: Wu, Muh-Cherng
Chang, Wen-Jen
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: capacity trading;semiconductor;neural network;genetic algorithm;design of experiment;response surface method
公開日期: 1-Oct-2008
摘要: This paper presents a multiple criteria decision approach for trading weekly tool capacity between two semiconductor tabs. Due to the high-cost characteristics of tools, a semiconductor company with multiple fabs (factories) may weekly trade their tool capacities. That is, a lowly utilized workstation in one fab may sell capacity to its highly utilized counterpart in the other fab. Wit and Chang [Wu, M. C., & Chang, W. J. (2007). A short-term capacity trading method for semiconductor fabs with partnership. Expert Systems with Application, 33(2), 476-483] have proposed a method for making weekly trading decisions between two wafer tabs. Compared with no trading, their method could effectively increase the two fabs' throughput for a longer period such as 8 weeks. However, their trading decision-making is based on a single criterion-number of weekly produced operations, which may still leave a space for improving. We therefore proposed a multiple criteria trading decision approach in order to further increase the two fabs' throughput. The three decision criteria are: number of operations, number of layers, and number of wafers. This research developed a method to find an optimal weighting vector for the three criteria. The method firstly used NN + GA (neural network + genetic algorithm) to find an optimal trading decision in each week, and then used DOE + RSM (design of experiment + response surface method) to find an optimal weighting vector for a longer period, say 10 weeks. Experiments indicated that the multiple criteria approach indeed outperformed the previous method in terms the fabs' long-term throughput. (C) 2007 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.eswa.2007.08.002
http://hdl.handle.net/11536/8332
ISSN: 0957-4174
DOI: 10.1016/j.eswa.2007.08.002
期刊: EXPERT SYSTEMS WITH APPLICATIONS
Volume: 35
Issue: 3
起始頁: 938
結束頁: 945
Appears in Collections:Articles


Files in This Item:

  1. 000257993700037.pdf