標題: The Impact of Nanocontact on Nanowire Based Nanoelectronics
作者: Lin, Yen-Fu
Jian, Wen-Bin
電子物理學系
Department of Electrophysics
公開日期: 1-Oct-2008
摘要: Nanowire-based nanoelectronic devices will be innovative electronic building blocks from bottom up. The reduced nanocontact area of nanowire devices magnifies the contribution of contact electrical properties. Although a lot of two-contact-based ZnO nanoelectronics have been demonstrated, the electrical properties bringing either from the nanocontacts or from the nanowires have not been considered yet. High quality ZnO nanowires with a small deviation and an average diameter of 38 nm were synthesized to fabricate more than thirty nanowire devices. According to temperature behaviors of current-voltage curves and resistances, the devices could be grouped into three types. Type I devices expose thermally activated transport in ZnO nanowires and they could be considered as two Ohmic nanocontacts of the Ti electrode contacting directly on the nanowire. For those nanowire devices having a high resistance at room temperatures, they can be fitted accurately with the thermionic-emission theory and classified into type II and III devices according to their rectifying and symmetrical current-voltage behaviors. The type II device has only one deteriorated nanocontact and the other one Ohmic contact on single ZnO nanowire. An insulating oxide layer with thickness less than 20 nm should be introduced to describe electron hopping in the nanocontacts, so as to signalize oneand high-dimensional hopping conduction in type II and III devices.
URI: http://dx.doi.org/10.1021/nl801347x
http://hdl.handle.net/11536/8272
ISSN: 1530-6984
DOI: 10.1021/nl801347x
期刊: NANO LETTERS
Volume: 8
Issue: 10
起始頁: 3146
結束頁: 3150
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