Title: Nano-roughness measurements with a modified Linnik microscope and the uses of full-field heterodyne interferometry
Authors: Chen, Yen-Liang
Jian, Zhi-Cheng
Hsieh, Hung-Chih
Wu, Wang-Tsung
Su, Der-Chin
光電工程學系
Department of Photonics
Keywords: roughness measurement;heterodyne interferometry;Linnik microscope;interference microscopy
Issue Date: 1-Dec-2008
Abstract: A collimated heterodyne light enters a modified Linnik microscope, and the full-field interference signals are taken by a fast CMOS camera. The sampling intensities recorded at each pixel are fitted to derive a sinusoidal signal, and its phase can be obtained. Next, the 2-D phase unwrapping technique is applied to derive the 2-D phase distribution. Then, Ingelstam's formula is used to calculate the height distribution. Last, the height distribution is filtered with the Gaussian filter, the roughness topography and its average roughness can be obtained and its validity is demonstrated. (c) 2008 Society of Photo-Optical Instrumentation Engineers. [DOI: 10.1117/1.3050357]
URI: http://dx.doi.org/10.1117/1.3050357
http://hdl.handle.net/11536/8077
ISSN: 0091-3286
DOI: 10.1117/1.3050357
Journal: OPTICAL ENGINEERING
Volume: 47
Issue: 12
End Page: 
Appears in Collections:Articles


Files in This Item:

  1. 000263304100019.pdf