標題: Reducing Fault Dictionary Size for Million-Gate Large Circuits
作者: Hong, Yu-Ru
Huang, Juinn-Dar
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Algorithms;Reliability;Fault dictionary;fault diagnosis;diagnostic resolution
公開日期: 2009
摘要: In general, fault dictionary is prevented from practical applications in fault diagnosis due to its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, some of them fail to bring down the size to an acceptable level, and others might not be able to handle today's million-gate circuits due to their high time and space complexity. In this article, an algorithm is presented to reduce the size of pass-fail dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.
URI: http://hdl.handle.net/11536/7995
http://dx.doi.org/10.1145/1497561.1497570
ISSN: 1084-4309
DOI: 10.1145/1497561.1497570
期刊: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
Volume: 14
Issue: 2
Appears in Collections:Articles


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