標題: White-light emissions from p-type porous silicon layers by high-temperature thermal annealing
作者: Tsai, W. -C.
Lin, J. -C.
Huang, K. -M.
Yang, P. -Y.
Wang, S. -J.
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-一月-2009
摘要: In this study, the white-light emissions, including red, green and blue colors, appearing on the same porous silicon samples are originally introduced by a thermal-annealing method. The SEM, FTIR, and PL are discussed for different annealing temperature cases. The FTIR is used to monitor the chemical bonding structures of the PS samples under different annealing temperatures. The results show that the variation of chemical bonding relates to the variation of the emission wavelength. The emission intensities of the blue-green-light components are enhanced with the increase of annealing temperature. The PL spectra cover the entire visible region under the excitations of He-Cd laser beam, and a strong white-light emission can be observed by the naked eye at room temperature. Copyright (C) EPLA, 2009
URI: http://dx.doi.org/10.1209/0295-5075/85/27002
http://hdl.handle.net/11536/7769
ISSN: 0295-5075
DOI: 10.1209/0295-5075/85/27002
期刊: EPL
Volume: 85
Issue: 2
結束頁: 
顯示於類別:期刊論文


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  1. 000263692900026.pdf