Title: Study of Al-Ti/Si bi-layer as the recording media for write-once HD-DVD optical disks
Authors: Mai, Hung-Chuan
Hsieh, Tsung-Eong
Jeng, Shiang-Yao
Chen, Chong-Ming
Wang, Jen-Long
Department of Materials Science and Engineering
Keywords: Write-once optical disk;Bi-layer recording structure;Signal properties;Microstructure
Issue Date: 15-Feb-2009
Abstract: Optimum structure for HD-DVD optical disks containing Al-Ti/Si bi-layer recording system was identified by reflectivity simulation and dynamic test of disk samples. For the disk sample with optimized structure, the maximum partial response signal-to-noise ratio (PRSNR) of 19.1 dB, minimum simulated bit error rate (sbER) of 1.7 X 10(-7) and modulation >0.6 were achieved at the writing power (P(W)) = 11.2 mW. Transmission electron microscopy (TEM) revealed that the polycrystalline granular clusters constitute the recording marks. Subsequent analyses evidenced that element mixing/alloy reactions occur in between Si and Al-Ti layers and the formation of Al(3.21)Si(0.47) crystalline phase is responsible for the signal recording in the disk samples. (C) 2008 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.matchemphys.2008.08.039
ISSN: 0254-0584
DOI: 10.1016/j.matchemphys.2008.08.039
Volume: 113
Issue: 2-3
Begin Page: 680
End Page: 684
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