標題: Distributional and inferential properties of the process accuracy and process precision indices
作者: Pearn, WL
Lin, GH
Chen, KS
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: process accuracy index;process precision index;process yield;process mean;process standard deviation
公開日期: 1998
摘要: Process capability indices such as C-p, k, and C-pk, have been widely used in manufacturing industry to provide numerical measures on process potential and performance. While C-p measures overall process variation, k measures the degree of process departure. In this paper, we consider the index C-p and a transformation of k defined as C-a = 1 - k which measures the degree of process centering. We refer to C-p as the process precision index, and C-a as the process accuracy index. We consider the estimators of C-p and C-a, and investigate their statistical properties. For C-p, we obtain the UMVUE and the MLE. We show that this UMVUE is consistent, and asymptotically efficient. For C-a, we investigate its natural estimator. We obtain the first two moments of this estimator, and show that the natural estimator is the MLE, which is asymptotically unbiased and asymptotically efficient. We also propose an efficient test based on the UMVUE of C-p. We show that the proposed test is the UMP test.
URI: http://hdl.handle.net/11536/73
ISSN: 0361-0926
期刊: COMMUNICATIONS IN STATISTICS-THEORY AND METHODS
Volume: 27
Issue: 4
起始頁: 985
結束頁: 1000
顯示於類別:期刊論文


文件中的檔案:

  1. 000072717900012.pdf