Title: Improved hot carrier reliability in strained-channel NMOSFETS with TEOS buffer layer
Authors: Lu, Ching-Sen
Lin, Horng-Chih
Lee, Yao-Jen
Huang, Tiao-Yuan
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Issue Date: 2007
URI: http://hdl.handle.net/11536/7212
http://dx.doi.org/10.1109/RELPHY.2007.369562
ISBN: 978-1-4244-0918-1
DOI: 10.1109/RELPHY.2007.369562
Journal: 2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL
Begin Page: 670
End Page: 671
Appears in Collections:Conferences Paper


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