標題: Improved hot carrier reliability in strained-channel NMOSFETS with TEOS buffer layer
作者: Lu, Ching-Sen
Lin, Horng-Chih
Lee, Yao-Jen
Huang, Tiao-Yuan
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2007
URI: http://hdl.handle.net/11536/7212
http://dx.doi.org/10.1109/RELPHY.2007.369562
ISBN: 978-1-4244-0918-1
DOI: 10.1109/RELPHY.2007.369562
期刊: 2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL
起始頁: 670
結束頁: 671
顯示於類別:會議論文


文件中的檔案:

  1. 000246989600146.pdf