Title: Orientation-dependent potential barriers in case of epitaxial Pt-BiFeO(3)-SrRuO(3) capacitors
Authors: Pintilie, L.
Dragoi, C.
Chu, Y. H.
Martin, L. W.
Ramesh, R.
Alexe, M.
Department of Materials Science and Engineering
Issue Date: 8-Jun-2009
Abstract: The leakage current in epitaxial BiFeO(3) capacitors with bottom SrRuO(3) and top Pt electrodes, grown by pulsed laser deposition on SrTiO(3) (100), SrTiO(3) (110), and SrTiO(3) (111) substrates, is investigated by current-voltage (I-V) measurements in the 100-300 K temperature range. It is found that the leakage current is interface-limited and strongly dependent on the orientation of the substrate. The potential barriers at the electrode interfaces are estimated to about 0.6, 0.77, and 0.93 eV for the (100), (110), and (111) orientations, respectively.
URI: http://dx.doi.org/10.1063/1.3152784
ISSN: 0003-6951
DOI: 10.1063/1.3152784
Volume: 94
Issue: 23
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Appears in Collections:Articles