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dc.contributor.authorWang, Hsiuyingen_US
dc.date.accessioned2014-12-08T15:08:35Z-
dc.date.available2014-12-08T15:08:35Z-
dc.date.issued2009-10-01en_US
dc.identifier.issn0167-9473en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.csda.2009.05.024en_US
dc.identifier.urihttp://hdl.handle.net/11536/6598-
dc.description.abstractIt is well known that the conventional p control chart constructed by the normal approximation for the binomial distribution suffers a serious inaccuracy in the monitor process when the true rate of nonconforming items is small. A similar problem also arises in the binomial confidence interval estimation. Adjusted confidence intervals are established in the literature to improve the coverage probability when the binomial proportion is small. In this paper, a new p control chart based on an adjusted confidence interval is established, which can substantially improve the existing control charts when the nonconforming rate is small. (C) 2009 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleComparison of p control charts for low defective rateen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.csda.2009.05.024en_US
dc.identifier.journalCOMPUTATIONAL STATISTICS & DATA ANALYSISen_US
dc.citation.volume53en_US
dc.citation.issue12en_US
dc.citation.spage4210en_US
dc.citation.epage4220en_US
dc.contributor.department統計學研究所zh_TW
dc.contributor.departmentInstitute of Statisticsen_US
dc.identifier.wosnumberWOS:000270624600027-
dc.citation.woscount8-
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