標題: Comparison of p control charts for low defective rate
作者: Wang, Hsiuying
統計學研究所
Institute of Statistics
公開日期: 1-Oct-2009
摘要: It is well known that the conventional p control chart constructed by the normal approximation for the binomial distribution suffers a serious inaccuracy in the monitor process when the true rate of nonconforming items is small. A similar problem also arises in the binomial confidence interval estimation. Adjusted confidence intervals are established in the literature to improve the coverage probability when the binomial proportion is small. In this paper, a new p control chart based on an adjusted confidence interval is established, which can substantially improve the existing control charts when the nonconforming rate is small. (C) 2009 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.csda.2009.05.024
http://hdl.handle.net/11536/6598
ISSN: 0167-9473
DOI: 10.1016/j.csda.2009.05.024
期刊: COMPUTATIONAL STATISTICS & DATA ANALYSIS
Volume: 53
Issue: 12
起始頁: 4210
結束頁: 4220
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