Title: Jitter Measurement and Compensation for Analog-to-Digital Converters
Authors: Fan, Chi-Wei
Wu, Jieh-Tsorng
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: Analog-to-digital conversion;calibration;clocks;jitter;sampling methods;signal reconstruction;signal sampling;time measurement
Issue Date: 1-Nov-2009
Abstract: Clock jitter is measured and digitized by a stochastic time-to-digital converter (TDC). This jitter information is used to compensate the sampling error of an analog-to-digital converter (ADC) caused by the clock jitter. The following two system scenarios are covered: 1) an ADC with a clean external clock and 2) an ADC with an external clock as the main jitter source. TDC calibrations for both scenarios are proposed. The calibrations are based on signal reconstruction and can be performed in the background. Both theoretical analyses and system simulations are provided to verify the proposed jitter compensation and TDC calibration techniques.
URI: http://dx.doi.org/10.1109/TIM.2009.2021209
http://hdl.handle.net/11536/6467
ISSN: 0018-9456
DOI: 10.1109/TIM.2009.2021209
Journal: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume: 58
Issue: 11
Begin Page: 3874
End Page: 3884
Appears in Collections:Articles


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