標題: Optimal Configuration of Hydrogen-Embrittlement-Fabricated Nanogaps for Surface-Conduction Electron-Emitter Display
作者: Li, Yiming
Cheng, Hui-Wen
傳播研究所
電子工程學系及電子研究所
Institute of Communication Studies
Department of Electronics Engineering and Institute of Electronics
關鍵字: Collected electron current;emitted electron current;field emission efficiency;focus capability;Fowler-Nordheim equation;finite-difference time-domain (FDTD) particle in cell (PIC);hydrogen embrittlement;Maxwell's equations;motion trajectory;nanogaps;palladium;separation width;surface conduction electron emitters;tilted angle
公開日期: 1-Nov-2009
摘要: Application of nanogaps for electron sources is fascinating in surface-conduction electron-emitter display. In contrast to rather complicated fabrication processes of the focused ion beam technique for the extremely narrow fissure, nanogaps fabricated by hydrogen embrittlement (HE) have thus been proposed as novel surface-conduction electron emitters due to their low turn-ON voltage, high emission current, high focus capability, and high emission efficiency. In this paper, we theoretically investigate effects of the separation width and the tilted angle of the nanogaps fabricated by HE method on the field emission efficiency using a 3-D finite-difference time-domain particle-in-cell simulation technique. The structure with a large tilted angle may result in a high emitted current, but the collected current on the anode is suppressed due to the strong local field around the tip. A small structure prevents the emitted electrons from spreading out, and thus, no current could be collected by the anode. Also, the structure with a wide (or a narrow) separation of gap weakens (or enhances) the field around the tip and reduces the collected electrons. For better emission efficiency and focus capability, the separation width and the tilted angle of the examined structure could vary from 57 to 117 nm and 30 degrees to 60 degrees, respectively.
URI: http://dx.doi.org/10.1109/TNANO.2009.2024535
http://hdl.handle.net/11536/6462
ISSN: 1536-125X
DOI: 10.1109/TNANO.2009.2024535
期刊: IEEE TRANSACTIONS ON NANOTECHNOLOGY
Volume: 8
Issue: 6
起始頁: 671
結束頁: 677
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