Development of A Performance Evaluation Index on Throughput
|關鍵字:||晶圓代工;產品組合;績效衡量;光罩層;foudry;product mix;performance evaluation;mask layer|
Wafer foundries have become the mainstream of semiconductor industry in Taiwan and one characteristic of foundries is that it produce many in kind but few in volume, and its product mix changes frequently.The frequent change of product mix causes many management difficulties, one of these is the performance evaluation on throughput. There is a great variation in wafer out because of product mix, so the index wafer out cannot fairly and effectively measure the performance on throughput. Leachman published his throughtput evaluation formula that evaluated throughput performance based on mask layers, but the formula was not applicable for all semiconductor companies, and was not well justified. The study first considers the loading situation of all workstations in different product mix. Based on the loading situation, we analyze and design new performance index, then find the relation formula between the index and the throughput, finally use the formula to be the conversion mechanism between product mix and throughput ot fairly and reasonably evaluate the throughput performace.
|Appears in Collections:||Thesis|