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dc.contributor.authorPan, Shan-Pengen_US
dc.contributor.authorWeng, Han-Fuen_US
dc.contributor.authorLin, Chih-Minen_US
dc.contributor.authorLiu, Tzong-Shien_US
dc.date.accessioned2014-12-08T15:07:41Z-
dc.date.available2014-12-08T15:07:41Z-
dc.date.issued2010en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://hdl.handle.net/11536/6045-
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.49.06GK05en_US
dc.description.abstractDynamic light scattering (DLS) is the most commonly used technique for measuring nanosphere sizes. In order to establish the traceability of the DLS method to SI units, relevant parameters have been measured in this study. Several studies have been reported on error sources in DLS. However, these studies lacked a systematic method of analyzing the uncertainty of DLS. In this paper we describe the DLS method and present a measurement uncertainty budget. Monodispersed polystyrene latex (PSL) spheres are selected as reference materials in the uncertainty evaluation. The measured nanosphere sizes are 20, 50, 100, 300, 500, and 1000 nm, among which the measurement results of 100, 300, and 500 nm nanospheres obtained using DLS are compared with those for an electrogravitational aerosol balance (EAB) method. The uncertainties for both methods are calculated, and the results of repeated measurements are presented with confidence levels of 95%. (C) 2010 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleUncertainty Analysis on Precision Measurement for Polystyrene Nanospheres Using Dynamic Light Scatteringen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.49.06GK05en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume49en_US
dc.citation.issue6en_US
dc.contributor.department機械工程學系zh_TW
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.identifier.wosnumberWOS:000278966300082-
dc.citation.woscount0-
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