標題: Using patent analyses to monitor the technological trends in an emerging field of technology: a case of carbon nanotube field emission display
作者: Chang, Pao-Long
Wu, Chao-Chan
Leu, Hoang-Jyh
經營管理研究所
Institute of Business and Management
關鍵字: Patent bibliometric analysis;Patent network analysis;Carbon nanotube field emission display (CNT-FED)
公開日期: 1-一月-2010
摘要: Carbon nanotube field emission display (CNT-FED) represents both emerging application of nanotechnology and revolutionary invention of display. Therefore, it is an important subject to monitor the states and trends of CNT-FED technology before the next stage of development. The present paper uses patent bibliometric analysis and patent network analysis to monitor the technological trends in the field of CNT-FED. These results firstly reveal the different aspects of patenting activities in the field of CNT-FED. Then, patent network analysis indicates the developing tendency of worldwide FED production based on the synthesis of CNT materials. Furthermore, key technologies of three clusters can be identified as the depositing CNT on substrate, coating phosphor on screen and assembling process for whole device. Finally, emitter material is taken for the key factor in R&D work to improve the efficacy in CNT-FED technology.
URI: http://dx.doi.org/10.1007/s11192-009-0033-y
http://hdl.handle.net/11536/5996
ISSN: 0138-9130
DOI: 10.1007/s11192-009-0033-y
期刊: SCIENTOMETRICS
Volume: 82
Issue: 1
起始頁: 5
結束頁: 19
顯示於類別:期刊論文


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  1. 000273950900002.pdf