標題: Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry
作者: Chiu, MH
Lee, JY
Su, DC
交大名義發表
光電工程學系
National Chiao Tung University
Department of Photonics
公開日期: 1-五月-1997
摘要: A new method for measuring the refractive index is presented, First, the phase difference between s and p polarizations that is due to the total internal reflection is measured by heterodyne interferometry. Then, substituting this phase difference into the Fresnel equations, we can obtain the refractive index of the test medium. (C) 1997 Optical Society of America.
URI: http://hdl.handle.net/11536/558
ISSN: 0003-6935
期刊: APPLIED OPTICS
Volume: 36
Issue: 13
起始頁: 2936
結束頁: 2939
顯示於類別:期刊論文


文件中的檔案:

  1. A1997WX24200031.pdf