Title: Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry
Authors: Chiu, MH
Lee, JY
Su, DC
交大名義發表
光電工程學系
National Chiao Tung University
Department of Photonics
Issue Date: 1-May-1997
Abstract: A new method for measuring the refractive index is presented, First, the phase difference between s and p polarizations that is due to the total internal reflection is measured by heterodyne interferometry. Then, substituting this phase difference into the Fresnel equations, we can obtain the refractive index of the test medium. (C) 1997 Optical Society of America.
URI: http://hdl.handle.net/11536/558
ISSN: 0003-6935
Journal: APPLIED OPTICS
Volume: 36
Issue: 13
Begin Page: 2936
End Page: 2939
Appears in Collections:Articles


Files in This Item:

  1. A1997WX24200031.pdf