標題: Direct Observation of Electron Dephasing due to Inelastic Scattering from Defects in Weakly Disordered AuPd Wires
作者: Zhong, Yuan-Liang
Sergeev, Andrei
Chen, Chii-Dong
Lin, Juhn-Jong
電子物理學系
物理研究所
Department of Electrophysics
Institute of Physics
公開日期: 21-May-2010
摘要: To identify and investigate the mechanisms of electron-phonon (e-ph) relaxation in weakly disordered metallic conductors, we measure the electron dephasing rate in a series of suspended and supported 15-nm thick AuPd wires. In a wide temperature range, from similar to 8 K to above 20 K, the e-ph interaction dominates in the dephasing processes. The corresponding relaxation rate reveals a quadratic temperature dependence, tau(-1)(e-ph) = A(ep)T(2), where A(ep) approximate to 5 x 10(9) K(-2) s(-1) is essentially the same for all samples studied. Our observations are shown to be in good agreement with the theory which predicts that, even in weakly disordered metallic structures at moderately low temperatures, the major mechanism of the e-ph relaxation is the electron scattering from vibrating defects and impurities.
URI: http://dx.doi.org/10.1103/PhysRevLett.104.206803
http://hdl.handle.net/11536/5392
ISSN: 0031-9007
DOI: 10.1103/PhysRevLett.104.206803
期刊: PHYSICAL REVIEW LETTERS
Volume: 104
Issue: 20
起始頁: 0
結束頁: 0
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