標題: Fabrication and X-ray absorption NaxCoO2 spectroscopy in layered cobaltate thin films
作者: Chang, W. J.
Lin, J.-Y.
Chung, T. Y.
Chen, J. M.
Hsu, C.-H.
Hsu, S. Y.
Uen, T. M.
Wu, K. H.
Gou, Y. S.
Juang, J. Y.
電子物理學系
物理研究所
Department of Electrophysics
Institute of Physics
關鍵字: NaxCoO2 thin film;layered cobaltates;lateral diffusion;X-ray diffraction;X-ray absorption spectroscopy
公開日期: 1-Mar-2007
摘要: NaxCoO2 (x similar to 0.68) thin films were fabricated on sapphire (0 0 0 1) substrates via the lateral diffusion of sodium into Co3O4 (1 1 1) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity rho(ab), the single phase and the metallic behaviors of these NaxCoO2 films can be identified. For the same sodium content x, rho(ab) is consistent with that of single crystals. In addition, the O 1s X-ray absorption near edge spectra of thin films are measured and compared with those of single crystals. (c) 2006 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.jmmm.2006.10.301
http://hdl.handle.net/11536/5168
ISSN: 0304-8853
DOI: 10.1016/j.jmmm.2006.10.301
期刊: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume: 310
Issue: 2
起始頁: E335
結束頁: E336
Appears in Collections:Conferences Paper


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