標題: Demonstration of edge roughness effect on the magnetization reversal of spin valve submicron wires
作者: Chiang, T. W.
Chang, L. J.
Yu, C.
Huang, S. Y.
Chen, D. C.
Yao, Y. D.
Lee, S. F.
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 12-七月-2010
摘要: We prepared submicron wide trilayer spin valve wires designed with periodic "spikes" as artificial roughness. The height and the pitch of the spikes were varied systematically. No obvious dependence was found between the roughness and the domain wall velocity when the spikes were smaller than a threshold of 30 nm for NiFe. The average velocity was slowed down when the height of the spikes were larger than the threshold. In-plane transverse magnetic fields help to reduce the critical current density for current induced domain-wall motion. Our results could be attributed to the space modulation of the local magnetization. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3463459]
URI: http://dx.doi.org/10.1063/1.3463459
http://hdl.handle.net/11536/5140
ISSN: 0003-6951
DOI: 10.1063/1.3463459
期刊: APPLIED PHYSICS LETTERS
Volume: 97
Issue: 2
結束頁: 
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