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Issue DateTitleAuthor(s)
15-Aug-2000Progress in the developments of (Ba,Sr)TiO3 (BST) thin films for Gigabit era DRAMsEzhilvalavan, S; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
23-Mar-2018Conductive bridge random access memory characteristics of SiCN based transparent device due to indium diffusionKumar, Dayanand; Aluguri, Rakesh; Chand, Umesh; Tseng, Tseung-Yuen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Enhancement of Stress-Memorization Technique on nMOSFETs by Multiple Strain-Gate EngineeringLu, Tsung Yi; Wang, Chin Meng; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-Mar-2011Generalized Hot-Carrier Degradation and Its Mechanism in Poly-Si TFTs Under DC/AC OperationsTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; Lin, Chih-Jung; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Sep-2003Characteristics of oxide breakdown and related impact on device of ultrathin (2.2 nm) silicon dioxideSu, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Cha, CP; See, YC; Sun, JYC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2011Impacts of NBTI/PBTI and Contact Resistance on Power-Gated SRAM With High-kappa Metal-Gate DevicesYang, Hao-I; Hwang, Wei; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2003An efficient algorithm for the reliability of consecutive-k-n networksChang, JC; Chen, RJ; Hwang, FK; 應用數學系; 資訊工程學系; Department of Applied Mathematics; Department of Computer Science
1-Aug-2015Design, Fabrication and Characterization of Low-Noise and High-Reliability Amorphous Silicon Gate Driver Circuit for Advanced FPD ApplicationsChiang, Chien-Hsueh; Li, Yiming; 傳播研究所; 電機資訊學士班; Institute of Communication Studies; Undergraduate Honors Program of Electrical Engineering and Computer Science
1-May-2008Reliability mechanisms of LTPS-TFT with HfO2 gate dielectric: PBTI, NBTI, and hot-carrier stressMa, Ming-Wen; Chen, Chih-Yang; Wu, Woei-Cherrig; Su, Chun-Jung; Kao, Kuo-Hsing; Chao, Tien-Sheng; Lei, Tan-Fu; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-Mar-2010Characterization of the Channel-Shortening Effect on P-Type Poly-Si TFTsTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display