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Issue DateTitleAuthor(s)
2010Measuring production yield for processes with multiple characteristicsPearn, W. L.; Cheng, Ya-Ching; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Feb-2013RISE: A RelIable and SEcure Scheme for Wireless Machine to Machine CommunicationsRen, Wei; Yu, Linchen; Ma, Liangli; Ren, Yi; 資訊工程學系; Department of Computer Science
1-Dec-2006Analysis of poly-Si TFT degradation under gate pulse stress using the slicing modelTai, Ya-Hsiang; Huang, Shih-Che; Chen, Chien-Kwen; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Sep-2015Soft-Error-Tolerant Design Methodology for Balancing Performance, Power, and ReliabilityChou, Hsuan-Ming; Hsiao, Ming-Yi; Chen, Yi-Chiao; Yang, Keng-Hao; Tsao, Jean; Lung, Chiao-Ling; Chang, Shih-Chieh; Jone, Wen-Ben; Chen, Tien-Fu; 資訊工程學系; Department of Computer Science
1-Jun-2002Fully process-compatible layout design on bond pad to improve wire bond reliability in CMOS ICsKer, MD; Peng, JJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Aug-2015Design, Fabrication and Characterization of Low-Noise and High-Reliability Amorphous Silicon Gate Driver Circuit for Advanced FPD ApplicationsChiang, Chien-Hsueh; Li, Yiming; 傳播研究所; 電機資訊學士班; Institute of Communication Studies; Undergraduate Honors Program of Electrical Engineering and Computer Science
2-Dec-2015Positive gate bias instability alleviated by self-passivation effect in amorphous InGaZnO thin-film transistorsLi, GongTan; Yang, Bo-Ru; Liu, Chuan; Lee, Chia-Yu; Tseng, Chih-Yuan; Lo, Chang-Cheng; Lien, Alan; Deng, ShaoZhi; Shieh, Han-Ping D.; Xu, NingSheng; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Nov-1997A heuristic approach to generating file spanning trees for reliability analysis of distributed computing systemsChen, DJ; Chen, RS; Huang, TH; 資訊科學與工程研究所; Institute of Computer Science and Engineering
1-Jul-2005Performance and reliability of poly-Si TFTs on FSG buffer layerDe Wang, S; Chang, TY; Chien, CH; Lo, WH; Sang, JY; Lee, JW; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2015New Method to Analyze the Shift of Floating Gate Charge and Generated Tunnel Oxide Trapped Charge Profile in NAND Flash Memory by Program/Erase EnduranceShirota, Riichiro; Yang, Bo-Jun; Chiu, Yung-Yueh; Chen, Hsuan-Tse; Ng, Seng-Fei; Wang, Pin-Yao; Chang, Jung-Ho; Kurachi, Ikuo; 交大名義發表; National Chiao Tung University