標題: 延續正反器之測試策略
Testing Strategies for Retention Flip-flops
作者: 徐浩文
Hsu, Hao-Wen
趙家佐
Chao, Chia-Tso
電子研究所
關鍵字: 延續正反器;測試;虛擬電源供應;測試向量自動產生器;Retention flip-flop;Testing;Virtual-VDD;ATPG
公開日期: 2012
摘要: 本篇論文提及關於測試延續正反器的幾項爭議,並且提供相對應的解決方法。嶄新的延續正反器測試程序被提出用來檢測延續正反器因製成所致的缺陷。此外,本篇論文提出特殊的測試向量自動產生器用於產生出基於盡量引發連線上的訊號轉換的測試向量。最後,整體實驗是運行在ISCAS 的標桿電路上,並且證實此測試向量自動產生器的優點以及能有效地測試延續正反器。
This thesis presents several issues about testing for retention flip-flops and proposes the corresponding solutions to those issues. A novel test procedure is proposed for detect many defects of retention flip-flops. Furthermore, a specialized ATPG framework is proposed to generate the test vectors for creating as many effective transitions on interconnects in the circuit as possible. The experimental results based on large ISCAS benchmark circuits demonstrate the efficiency of testing retention flip-flops and the advantages of using our proposed ATPG framework.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT079911620
http://hdl.handle.net/11536/49155
Appears in Collections:Thesis


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