標題: THE DIELECTRIC RELIABILITY OF INTRINSIC THIN SIO2-FILMS THERMALLY GROWN ON A HEAVILY DOPED SI SUBSTRATE - CHARACTERIZATION AND MODELING
作者: CHEN, CF
WU, CY
LEE, MK
CHEN, CN
工學院
College of Engineering
公開日期: 1-Jul-1987
URI: http://hdl.handle.net/11536/4627
ISSN: 0018-9383
期刊: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 34
Issue: 7
起始頁: 1540
結束頁: 1552
Appears in Collections:Articles


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  1. A1987H858400017.pdf