An AOI System for Side View SMD-LED Defect
|關鍵字:||側照式SMD-LED;自動光學檢測系統;影像處理;圖形識別;瑕疵檢測;side-view SMD-LED;auto-optical inspection;image process;pattern recognition;defect detection|
In recent years, side view SMD-LED has accessed market demand due to its many advantages, such as small size, low power consumption , high efficiency, etc. With billion demands and so as production volumn, it is difficult to meet the requirement of high detection rate and consistent defect standard by traditional manual visual inspection. Therefore, an AOI system was developed in this Thesis. Under the consideration of real production line, every side view SMD-LED, was to be inspected. The types of defect may include: missing component, wrong orientation, inverse polarity, missing polarity, dirty surface, and surface nick .The developed inspection system includes hardware system, software system and detection algorithm. First, the hardware systems was triggered to take the image of one SMD-LED component in the packaged tape. Second , the ROI and the quality specification to judge the defect were set interactively by inspection expert. Finally, a set of image processing and pattern recognition methods were designed to inspect the defects. After a great deal of experimentation, the developed side view SMD-LED auto-inspection system showed its efficiency and effectiveness in promoting the side view SMD-LED inspection quality.
|Appears in Collections:||Thesis|
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