標題: AN EFFICIENT SEMI-EMPIRICAL MODEL OF THE IV CHARACTERISTICS FOR LDD MOSFETS
作者: CHUNG, SSS
LIN, TS
CHEN, YG
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-Sep-1989
URI: http://dx.doi.org/10.1109/16.34231
http://hdl.handle.net/11536/4298
ISSN: 0018-9383
DOI: 10.1109/16.34231
期刊: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 36
Issue: 9
起始頁: 1691
結束頁: 1702
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  1. A1989AL12900021.pdf