|標題:||An unexpected meeting of four seemingly unrelated problems: graph testing, DNA complex screening, superimposed codes and secure key distribution|
|作者:||Chen, H. B.|
Du, D. Z.
Hwang, F. K.
Department of Applied Mathematics
|關鍵字:||group testing;pooling designs;superimposed codes;graph testing|
|摘要:||This paper discusses the relation among four problems: graph testing, DNA complex screening, superimposed codes and secure key distribution. We prove a surprising equivalence relation among these four problems, and use this equivalence to improve current results on graph testing. In the rest of this paper, we give a lower bound for the minimum number of tests on DNA complex screening model.|
|期刊:||JOURNAL OF COMBINATORIAL OPTIMIZATION|
|Appears in Collections:||Conferences Paper|
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