標題: DEVELOPMENT OF TEMPERATURE-STABLE THICK-FILM DIELECTRICS .3. ROLE OF GLASS ON THE MICROSTRUCTURE EVOLUTION OF A THICK-FILM DIELECTRIC
作者: CHIOU, BS
LIU, KC
DUH, JG
CHUNG, MC
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-Sep-1991
摘要: Glass phase plays an important role in the characteristics of thick-film microelectronics. A dielectric system in BaTiO3 and SrTiO3 containing PbO, B2O3, SiO2, and Al2O3 glass constituents is investigated. Microstructure evolution and phase distribution after thermal aging are studied with the aid of electron microscope and X-ray diffractometer. It is observed that the phases in 40 vol% BaTiO3-25 vol% SrTiO3-35 vol% glass thick-film dielectric are not altered after 500-degrees-C aging for 480 h. The variation in surface morphology after long time aging is attributed to the precipitation of heavy metal component from the glass which acts as a diffusion species and then dissolves the crystalline phase during firing. The presence of glass in the dielectric enhances the formation of solid solution (Ba(x)Sr1-x)TiO3 and results in the broadening of the Curie peak.
URI: http://dx.doi.org/10.1109/33.83957
http://hdl.handle.net/11536/3695
ISSN: 0148-6411
DOI: 10.1109/33.83957
期刊: IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY
Volume: 14
Issue: 3
起始頁: 645
結束頁: 649
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