標題: New transient detection circuit for system-level ESD protection
作者: Yen, Cheng-Cheng
Liao, Chi-Sheng
Ker, Ming-Dou
電機學院
College of Electrical and Computer Engineering
公開日期: 2008
摘要: A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. By including this new proposed on-chip transient detection circuit, a hardware/firmware solution cooperated with power-on reset circuit can be co-designed to fix the system-level ESD issues. The circuit performance to detect different positive and negative ESD-induced fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.18-mu m CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping.
URI: http://hdl.handle.net/11536/3340
http://dx.doi.org/10.1109/VDAT.2008.4542442
ISBN: 978-1-4244-1616-5
DOI: 10.1109/VDAT.2008.4542442
期刊: 2008 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), PROCEEDINGS OF TECHNICAL PROGRAM
起始頁: 180
結束頁: 183
顯示於類別:會議論文


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  1. 000256565800044.pdf