Title: New transient detection circuit for system-level ESD protection
Authors: Yen, Cheng-Cheng
Liao, Chi-Sheng
Ker, Ming-Dou
電機學院
College of Electrical and Computer Engineering
Issue Date: 2008
Abstract: A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. By including this new proposed on-chip transient detection circuit, a hardware/firmware solution cooperated with power-on reset circuit can be co-designed to fix the system-level ESD issues. The circuit performance to detect different positive and negative ESD-induced fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.18-mu m CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping.
URI: http://hdl.handle.net/11536/3340
http://dx.doi.org/10.1109/VDAT.2008.4542442
ISBN: 978-1-4244-1616-5
DOI: 10.1109/VDAT.2008.4542442
Journal: 2008 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), PROCEEDINGS OF TECHNICAL PROGRAM
Begin Page: 180
End Page: 183
Appears in Collections:Conferences Paper