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dc.contributor.authorCheng, YJen_US
dc.contributor.authorLee, THen_US
dc.contributor.authorShen, WZen_US
dc.date.accessioned2014-12-08T15:48:51Z-
dc.date.available2014-12-08T15:48:51Z-
dc.date.issued1998-08-01en_US
dc.identifier.issn1350-2425en_US
dc.identifier.urihttp://hdl.handle.net/11536/32481-
dc.description.abstractThe distributed knockout switch has multiple paths between any input and output pair and thus is inherently robust to faults without the need of adding any additional switch elements. However, to achieve fault tolerance, one has to first detect and locate the faults. The authors present an efficient fault diagnosis procedure to detect, locate. and identify the fault type of single switch element faults for the switch element array of the distributed knockout switch. To facilitate fault diagnosis, the operation of switch elements is slightly modified. The diagnosis procedure can locate most single switch element faults in two phases. Faults which cannot be located in two phases can always be located in a third phase. Binary search algorithms are developed to locate some kinds of single switch element faults in the third phase.en_US
dc.language.isoen_USen_US
dc.subjectdistributed knockout switchen_US
dc.subjectfault diagnosis procedureen_US
dc.subjectswitch element arrayen_US
dc.titleFault diagnosis of a distributed knockout switchen_US
dc.typeArticleen_US
dc.identifier.journalIEE PROCEEDINGS-COMMUNICATIONSen_US
dc.citation.volume145en_US
dc.citation.issue4en_US
dc.citation.spage241en_US
dc.citation.epage248en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000075769500005-
dc.citation.woscount0-
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