標題: Fault diagnosis of a distributed knockout switch
作者: Cheng, YJ
Lee, TH
Shen, WZ
電子工程學系及電子研究所
電信工程研究所
Department of Electronics Engineering and Institute of Electronics
Institute of Communications Engineering
關鍵字: distributed knockout switch;fault diagnosis procedure;switch element array
公開日期: 1-八月-1998
摘要: The distributed knockout switch has multiple paths between any input and output pair and thus is inherently robust to faults without the need of adding any additional switch elements. However, to achieve fault tolerance, one has to first detect and locate the faults. The authors present an efficient fault diagnosis procedure to detect, locate. and identify the fault type of single switch element faults for the switch element array of the distributed knockout switch. To facilitate fault diagnosis, the operation of switch elements is slightly modified. The diagnosis procedure can locate most single switch element faults in two phases. Faults which cannot be located in two phases can always be located in a third phase. Binary search algorithms are developed to locate some kinds of single switch element faults in the third phase.
URI: http://hdl.handle.net/11536/32481
ISSN: 1350-2425
期刊: IEE PROCEEDINGS-COMMUNICATIONS
Volume: 145
Issue: 4
起始頁: 241
結束頁: 248
顯示於類別:期刊論文


文件中的檔案:

  1. 000075769500005.pdf