標題: Finite element analysis of antireflective silicon nitride sub-wavelength structures for solar cell applications
作者: Lee, Huang-Ming
Sahoo, Kartika Chandra
Li, Yiming
Wu, Jong-Ching
Chang, Edward Yi
材料科學與工程學系
電機工程學系
Department of Materials Science and Engineering
Department of Electrical and Computer Engineering
關鍵字: Silicon nitride;Sub-wavelength structure;Finite element simulation;Antireflection coating;Solar cell
公開日期: 1-Oct-2010
摘要: We numerically calculate the spectral reflectivity of the silicon nitride (Si(3)N(4)) sub-wavelength structure (SWS) using a two-dimensional finite element simulation. The geometry-dependent effective reflectance of the Si(3)N(4) SWS over the wavelength ranging from 400 nm to 1000 nm is examined and the structure of Si(3)N(4) SWS is further optimized for the lowest effective reflectance. A p-n junction solar cell efficiency based on the optimized Si(3)N(4) SWS is also calculated, resulting in an improvement of 0.98% in efficiency than that of single layer antireflection coatings. (C) 2010 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.tsf.2010.04.078
http://hdl.handle.net/11536/32113
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2010.04.078
期刊: THIN SOLID FILMS
Volume: 518
Issue: 24
起始頁: 7204
結束頁: 7208
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