|標題:||Scan-Cell Reordering for Minimizing Scan-Shift Power Based on Nonspecified Test Cubes|
Chao, Mango C. -T.
Department of Electronics Engineering and Institute of Electronics
|關鍵字:||Algorithms;Design;Scan testing;DFT;low-power testing|
|摘要:||This article presents several scan-cell reordering techniques to reduce the signal transitions during the test mode while preserving the don't-care bits in the test patterns for a later optimization. Combined with a pattern-filling technique, the proposed scan-cell reordering techniques can utilize both high response correlations and pattern correlations to simultaneously minimize scan-out and scan-in transitions. Those scan-shift transitions can be further reduced by selectively using the inverse connections between scan cells. In addition, the trade-off between routing overhead and power consumption can also be controlled by the proposed scan-cell reordering techniques. A series of experiments are conducted to demonstrate the effectiveness of each of the proposed techniques individually.|
|期刊:||ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS|
|Appears in Collections:||Articles|
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