標題: Analyzing accelerated degradation data by nonparametric regression
作者: Shiau, JJH
Lin, HH
統計學研究所
Institute of Statistics
關鍵字: accelerated degradation test;acceleration factor;accelerated life-stress degradation model;local linear regression smoother;nonparametric regression;stochastic process
公開日期: 1-六月-1999
摘要: This paper presents a nonparametric regression accelerated life-stress (NPRALS) model for accelerated degradation data wherein the data consist of groups of degrading curve data. In contrast to the usual parametric modeling, a nonparametric regression model relaxes assumptions on the form of the regression functions and lets data speak for themselves in searching for a suitable model for data. NPRALS assumes that various stress levels affect only the degradation rate, but not the shape of the degradation curve. An algorithm is presented for estimating the components of NPRALS. By investigating the relationship between the acceleration factors and the stress levels, the mean time to failure estimate of the product under the usual use condition is obtained. The procedure is applied to a set of data obtained from an accelerated degradation test for a light emitting diode product. The results look very promising. The performance of NPRALS is further checked by a simulated example and found satisfactory. We anticipate that NPRALS can be applied to other applications as well.
URI: http://dx.doi.org/10.1109/24.784273
http://hdl.handle.net/11536/31291
ISSN: 0018-9529
DOI: 10.1109/24.784273
期刊: IEEE TRANSACTIONS ON RELIABILITY
Volume: 48
Issue: 2
起始頁: 149
結束頁: 158
顯示於類別:期刊論文


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  1. 000082105800008.pdf