標題: Fluctuation-enhanced conductivity in YBa2Cu2Ox (6.5 <= x <= 6.95) and Tl2Ba2Ca2Cu3O10 +/-delta
作者: Juang, JY
Hsieh, MC
Luo, CW
Uen, TM
Wu, KH
Gou, YS
電子物理學系
Department of Electrophysics
關鍵字: fluctuation effects;oxygen stoichiometry;Cu-chains;coherence length
公開日期: 1-一月-2000
摘要: The fluctuation-induced conductivity (Delta sigma(T)) near T-c of a sole YBa2Cu3Ox (YBCO) film with various precisely controlled oxygen contents (6.5 less than or equal to x less than or equal to 6.95) was studied and compared with those obtained from its Tl-based counterparts. For YBCO films with x > 6.7, Delta sigma (T) displays a distinct 3D to 2D crossover as the temperature approaches T-c. On the other hand, as T -->T-c, Delta sigma (T) of both Tl-based and YBCO film with x less than or equal to 6.7 exhibits a reversed 2D to 3D crossover. It is suggestive that the coupling between the CuO2 layers may have changed significantly with reducing oxygen. (C) 2000 Elsevier Science B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/S0921-4534(99)00566-3
http://hdl.handle.net/11536/30830
ISSN: 0921-4534
DOI: 10.1016/S0921-4534(99)00566-3
期刊: PHYSICA C
Volume: 329
Issue: 1
起始頁: 45
結束頁: 50
顯示於類別:期刊論文


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  1. 000084672700007.pdf