Title: SEESIM - A FAST SYNCHRONOUS SEQUENTIAL-CIRCUIT FAULT SIMULATOR WITH SINGLE-EVENT EQUIVALENCE
Authors: WU, CP
LEE, CL
SHEN, WZ
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: FAULT SIMULATION;SINGLE-EVENT EQUIVALENCE
Issue Date: 1-Apr-1993
Abstract: The paper presents a concept of single event equivalence to be used in the sequential circuit fault simulator. The concept dynamically identifies the equivalent faults for a simulated pattern. It combines advantages of the fanout-free region, critical path tracing and the dominator concept, which were applicable only to combinational circuit fault simulation. The implemented fault simulator, SEESIM, based on the concept, demonstrated a performance superior to that of a state-of-the-art concurrent fault simulator, and comparable to that of parallel-pattern single-fault propagation simulators. It requires a minimal amount of memory and, because of its simplicity, can be easily extended to multilogic or higher level simulation.
URI: http://hdl.handle.net/11536/3072
ISSN: 0956-3768
Journal: IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS
Volume: 140
Issue: 2
Begin Page: 101
End Page: 105
Appears in Collections:Articles


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  1. A1993LF60700005.pdf