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dc.contributor.authorLee, WHen_US
dc.contributor.authorTseng, TYen_US
dc.contributor.authorHennings, Den_US
dc.date.accessioned2014-12-08T15:45:40Z-
dc.date.available2014-12-08T15:45:40Z-
dc.date.issued2000-03-01en_US
dc.identifier.issn0957-4522en_US
dc.identifier.urihttp://dx.doi.org/10.1023/A:1008985616585en_US
dc.identifier.urihttp://hdl.handle.net/11536/30718-
dc.description.abstractMicrostructure and dielectric properties of (Ba1-xCax)(z)(Ti0.99-yZry Mn-0.01)O-3 (BCTZM) with various cation ratios (A/B) sintered in reducing atmosphere and then annealed to reoxidize the ceramic bodies were investigated. With decreasing A/B cation ratio, concurrent with the grain size reduction, the insulation resistance and lifetime of the BCTZM are both increased. The degradation of insulation resistance is closely related to oxygen partial pressure used during annealing and the resulting microstructure of the ceramics. Within the same volume, the specimen with fine grain size provides more grain boundaries, in comparison to large grain size specimens, which helps in providing an efficient diffusion pathway for oxygen during annealing. The result of oxidation of the Mn, that is, a change in the valence state of Mn from Mn+2 to Mn+3 is confirmed from thermogravimetric analysis and electron paramagnetic resonance analysis.en_US
dc.language.isoen_USen_US
dc.titleEffects of A/B cation ratio on the microstructure and lifetime of (Ba1-xCax)(z)(Ti0.99-y ZryMn0.01)O-3 (BCTZM) sintered in reducing atmosphereen_US
dc.typeArticleen_US
dc.identifier.doi10.1023/A:1008985616585en_US
dc.identifier.journalJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICSen_US
dc.citation.volume11en_US
dc.citation.issue2en_US
dc.citation.spage157en_US
dc.citation.epage162en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000086165300011-
dc.citation.woscount18-
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