標題: DESIGN OF PSEUDOEXHAUSTIVE TESTABLE PLA WITH LOW OVERHEAD
作者: SHEN, WZ
HWANG, GH
HSU, WJ
JAN, YJ
電控工程研究所
Institute of Electrical and Control Engineering
關鍵字: BUILT-IN SELF-TEST;DESIGN FOR TESTABILITY;PROGRAMMABLE LOGIC ARRAY;PSEUDOEXHAUSTIVE TESTING
公開日期: 1-七月-1993
摘要: The pseudoexhaustive testing (PET) scheme is a economic approach to test a large embedded programmable logic array (PIA). In this paper, we propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying our algorithm, both the area overhead and test length are reduced significantly.
URI: http://dx.doi.org/10.1109/12.237730
http://hdl.handle.net/11536/2948
ISSN: 0018-9340
DOI: 10.1109/12.237730
期刊: IEEE TRANSACTIONS ON COMPUTERS
Volume: 42
Issue: 7
起始頁: 887
結束頁: 891
顯示於類別:期刊論文


文件中的檔案:

  1. A1993MB58300012.pdf