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dc.contributor.authorLee, JYen_US
dc.contributor.authorSu, DCen_US
dc.date.accessioned2014-12-08T15:43:17Z-
dc.date.available2014-12-08T15:43:17Z-
dc.date.issued2001-11-01en_US
dc.identifier.issn0030-4018en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0030-4018(01)01515-2en_US
dc.identifier.urihttp://hdl.handle.net/11536/29297-
dc.description.abstractWhen the optical path difference is not zero, the phase of the interferogram is strongly influenced by the wavelength variation of the light source. Under this condition, the phase variation can be estimated with a phase quadrature interferometric technique. And the central fringe of the interferogram can be identified as the, phase variation remains unchanged. Based on this fact, an improved method to identify the central fringe is presented. It has some merits, such as simple optical setup, easier operation in real time, inexpensive, ability to judge which arm of interferometer is longer, etc. The feasibility is demonstrated with 10 nm resolution. (C) 2001 Elsevier Science B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectcentral fringeen_US
dc.subjectquadrature interferometryen_US
dc.subjectwhite-light interferometryen_US
dc.titleCentral fringe identification by phase quadrature interferometric technique and tunable laser-diodeen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/S0030-4018(01)01515-2en_US
dc.identifier.journalOPTICS COMMUNICATIONSen_US
dc.citation.volume198en_US
dc.citation.issue4-6en_US
dc.citation.spage333en_US
dc.citation.epage337en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000172002100013-
dc.citation.woscount9-
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