標題: Optimum design for a thermally stable multifinger power transistor with temperature-dependent thermal conductivity
作者: Liao, CH
Lee, CP
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: ballasting resistor;coupling current-voltage (I-V) equations;heterojunction bipolar transistor;multifinger transistor;temperature dependent thermal conductivity;thermal effect
公開日期: 1-五月-2002
摘要: The thermal stability of multifinger bipolar transistors has been analyzed theoretically. Coupled equations are solved to study the onset of instability and its dependence on the distributions of ballasting resistors. We extended our previous work on the multiple-finger transistor thermal stability from the simple coupled thermal-electrical feedback equation to the more accurate I-V equation and taking the temperature dependence of the thermal conductivity into consideration. Transistors with three-fingers and N-fingers have been analyzed. Two design procedures, uniform current design and uniform temperature design, of the best ballasting resistor distribution for optimum thermal stability operation were developed. Using these design flows, we can design the best ballasting resistor needed for thermal stable operation under the specified current level or specified junction temperature.
URI: http://dx.doi.org/10.1109/16.998602
http://hdl.handle.net/11536/28804
ISSN: 0018-9383
DOI: 10.1109/16.998602
期刊: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 49
Issue: 5
起始頁: 909
結束頁: 915
顯示於類別:期刊論文


文件中的檔案:

  1. 000175235300028.pdf