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dc.contributor.authorKuo, JTen_US
dc.contributor.authorSu, KYen_US
dc.date.accessioned2014-12-08T15:42:25Z-
dc.date.available2014-12-08T15:42:25Z-
dc.date.issued2002-05-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/22.999161en_US
dc.identifier.urihttp://hdl.handle.net/11536/28802-
dc.description.abstractClosed-form expression is derived for the fourfold integral involved in the evaluation of the capacitance of a charged plate using the Galerkin's procedure in the method of moments. The dimensions of each rectangular subsection for discretizing the conducting plate can be arbitrary. The calculated solutions converge faster than the point-matching results, as expected.en_US
dc.language.isoen_USen_US
dc.subjectGalerkin's procedureen_US
dc.subjectmethod of momentsen_US
dc.titleAnalytical evaluation of the MoM matrix elements for the capacitance of a charged plateen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/22.999161en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume50en_US
dc.citation.issue5en_US
dc.citation.spage1435en_US
dc.citation.epage1436en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000175334700026-
dc.citation.woscount5-
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