標題: BIST scheme for DAC testing
作者: Chang, SJ
Lee, CL
Chen, JE
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 18-七月-2002
摘要: A low-cost, built-in self-test (BIST) scheme for a digital-to-analogue converter (DAC) is presented. The basic idea is to convert the DAC output voltages corresponding to different input codes into different oscillation frequencies through a voltage controlled oscillator (VCO), and further transfer these frequencies to different digital codes using a counter. According to the input and output codes, performances of a DAC, such as offset error, gain error, differential nonlinearity (DNL), integral nonlinearity (INL), could be effectively detected by simply using digital circuits rather than complex analogue ones. In addition, the annoying DAC output noise could be naturally filtered out by this BIST method.
URI: http://dx.doi.org/10.1049/el:20020530
http://hdl.handle.net/11536/28659
ISSN: 0013-5194
DOI: 10.1049/el:20020530
期刊: ELECTRONICS LETTERS
Volume: 38
Issue: 15
起始頁: 776
結束頁: 777
顯示於類別:期刊論文


文件中的檔案:

  1. 000177339100008.pdf