標題: RELIABILITY STUDIES OF 0.85 MU-M VERTICAL-CAVITY SURFACE-EMITTING LASERS - 50000-H MTTF AT 25-DEGREES-C
作者: WU, CC
TAI, K
HAUNG, KF
電子物理學系
電控工程研究所
光電工程學系
Department of Electrophysics
Institute of Electrical and Control Engineering
Department of Photonics
關鍵字: SEMICONDUCTOR LASERS;RELIABILITY
公開日期: 28-十月-1993
摘要: Reliability studies of gain-guieded 0.85 mum GaAs/AlGaAs quantum well surface emitting lasers were performed on 45 randomly selected lasers operated at 25, 50 or 90-degrees-C with biased currents up to 15 mA (about four times the threshold values). At 25-degrees-C, no noticeable degradation was seen after 5000 h of operation. A 14% reduction of power was seen at 50-degrees-C after 2700h. A faster degradation on power output was seen at 90-degrees-C, though the lasers are still functional after 1000h. The mean time toward failure (MTTF) of these lasers operated at 25-degrees-C and 15mA is extrapolated to be approximately 5 x 10(4)h.
URI: http://hdl.handle.net/11536/2810
ISSN: 0013-5194
期刊: ELECTRONICS LETTERS
Volume: 29
Issue: 22
起始頁: 1953
結束頁: 1954
顯示於類別:期刊論文


文件中的檔案:

  1. A1993NE96800034.pdf