標題: Capability measures for processes with multiple characteristics
作者: Chen, KS
Pearn, WL
Lin, PC
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: capability zone;MCPCA chart;multiple characteristics;process capability index;process yield index
公開日期: 1-Mar-2003
摘要: Process capability indices, such as C-p, C-a, and C-pk, have been widely used in the manufacturing industry providing numerical measures on process precision, process accuracy, and process performance. Capability measures for processes with a single characteristic have been investigated extensively. However, capability measures for processes with multiple characteristics are comparatively neglected In this paper, we consider a generalization of the yield index S-pk proposed by Boyles, for processes with multiple characteristics. We establish a relationship between the generalization and the process yield. We also develop a control chart based on the proposed generalization, which displays all the characteristic measures in one single chart. Using the chart, the engineers can effectively monitor and control the performance of all process characteristics simultaneously. Copyright (C) 2003 John Wiley Sons, Ltd.
URI: http://dx.doi.org/10.1002/qre.513
http://hdl.handle.net/11536/28059
ISSN: 0748-8017
DOI: 10.1002/qre.513
期刊: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
Volume: 19
Issue: 2
起始頁: 101
結束頁: 110
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