標題: An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators
作者: Pearn, WL
Shu, MH
工業工程與管理學系
Department of Industrial Engineering and Management
公開日期: 1-Mar-2003
摘要: In assessing the performance of normal stable manufacturing processes with one-sided specification limits, process capability indices C-PU and C-PL have been widely used to measure the process capability. The purpose of this paper is to develop an algorithm to compute the lower confidence bounds on C-PU and C-PL using the UMVUEs of C-PU and C-PL. The lower confidence bound presents a measure on the minimum capability of the process based on the sample data. We also provide tables for the engineers/practitioners to use in measuring their processes. A real-world example taken from a microelectronics device manufacturing process is investigated to illustrate the applicability of the algorithm. Implementation of the existing statistical theory for capability assessment fills the gap between the theoretical development and the in-plant applications. (C) 2003 Elsevier Science Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/S0026-2714(02)00264-0
http://hdl.handle.net/11536/28046
ISSN: 0026-2714
DOI: 10.1016/S0026-2714(02)00264-0
期刊: MICROELECTRONICS RELIABILITY
Volume: 43
Issue: 3
起始頁: 495
結束頁: 502
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